Material Characterization

CrystaComm,utilizes state-of-the-art characterization tools and techniques for measuring the properties of InP crystals. These ensure that wafers shipped meet the specifications. CrystaComm material has been analyzed at a number of research organizations using the most advanced techniques available. The X-ray FWHM map shown below was measured at UCLA. It shows narrow FWHM with excellent uniformity over the wafer for CrystaComm InP wafers.